Identity, Security, Payments, Biometrics, Smart Cards and Authentication News

CISC Semiconductor Unveils RFID Eval Kit.

Wednesday, August 8, 2007

CISC Semiconductor this morning announced a new RFID tag evaluation tool combining hardware and software from National Instruments (NI), RFID Update reports.

Called the RFID Measurement & Evaluation Test System (MeETS), the kit targets “everyone from tag manufacturers to end users to RFID test labs as a solution for robust, scientific testing and measurement of RFID tags,” according to RFID Update. [end] 

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